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Announced the CL-6200 non-contact thickness gauge, which measures the thickness of conductors, semiconductors, and insulators without contact.

  • CL-6200 series
    CL-6200 series

The "CL-6200 Series Non-Contact Thickness Gauge" is a non-contact thickness gauge designed for use in combination with our "VE Series" capacitive displacement sensors. It employs a newly developed measurement method (patent pending) to achieve the industry's first non-contact thickness measurement of gallium arsenide (GaAs) wafers. Furthermore, by using auxiliary signals and user-defined calculation formulas, it can also measure the thickness of coatings applied to metal plates. With a built-in secondary processing function, it can perform measurement and data processing in a single unit. Of course, it can also be used as a 2-channel high-precision displacement gauge.
With a wide range of interfaces included as standard, it enhances compatibility with external devices and adopts a design philosophy that prioritizes system expandability. It comes standard with Centronics-compliant output for printers and RS-232C for PC interfaces, with a GPIB interface available as an option. For connection to a PLC, it is equipped with an open collector BCD output as standard, and an inline parallel I/O interface can also be selected as an option.

  • price
    Starting price from ¥1,000,000
  • Sales start date
    From December 4, 1996

The information on this page is based on the information available at the time of publication.
Please note that if product sales are discontinued, organizational changes are made, or specifications are changed after publication, the information may differ from the latest information.

This page is created by an automatic translation system based on the information in the Japanese version. Details