- Achieved increased sensitivity (20 dB UP) and a maximum resolution of 0.1 μm/s.
- Lightweight and compact
- High safety
- Information necessary for installation and measurement is displayed on the sensor.
- Magnifying the object with a CCD camera
- A wide range of options to expand functionality
In various industrial fields, including electronic and electrical products, the miniaturization and precision of components, such as the extremely small active components found in mobile phones, are progressing, creating a demand for high-precision measurement and analysis of minute vibrations. In addition to pursuing improved product performance, there is a growing demand for low vibration and low noise from the perspectives of environmental performance, ease of use, and comfort. Under these circumstances, Ono Sokki has developed a new generation of vibration meter that measures vibrations generated by high-temperature objects and microstructures, where it is difficult to attach acceleration detectors, in a non-contact manner with high precision, based on the know-how accumulated over many years in the field of vibration measurement and analysis.
The LV-1720 is a non-contact laser Doppler vibration meter that measures vibrations in the frequency range of 1 to 300 kHz. Through the adoption of a new optical system and a completely redesigned signal processing system and platform, it achieves a significant increase in sensitivity of 20 dB (compared to our previous models), and a maximum resolution of 0.1 μm/s. By capturing even the minute vibrations of objects, which were previously difficult to detect, with a high signal-to-noise ratio, it enables high-precision vibration measurement and analysis. The small, lightweight sensor (approximately 650 g) with a built-in interferometer can be approached as close as 100 mm as standard, and a level indicator on the sensor allows for easy confirmation of the detection status, significantly improving operability in conjunction with improved detection sensitivity. A wide range of options are available, including a camera unit that is easy to attach and allows coaxial observation of the measurement site, a fringe count displacement meter unit, and a wide-range unit that enables detection up to 20 MHz. This technology enables measurement of lightweight, minute objects, thin films, transparent films, surface runout of rotating disks, through glass, and high-temperature objects—all aspects that cannot be measured with contact-type vibration sensors. It can be used in a wide range of fields, including the transmission characteristics of optical pickups in CDs, MOs, and DVDs, the components of HDDs, movable mechanism analysis, thin-film vibration and main unit vibration analysis of mobile phone microphones and receivers, automotive, plant equipment, and micromachine applications. When combined with a waveform analyzer (FFT analyzer), it not only measures vibration but also captures, visualizes, and analyzes the vibration state with high precision.
